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Search for "self-sensing probe" in Full Text gives 1 result(s) in Beilstein Journal of Nanotechnology.
Optimizing qPlus sensor assemblies for simultaneous scanning tunneling and noncontact atomic force microscopy operation based on finite element method analysis
Beilstein J. Nanotechnol. 2017, 8, 657–666, doi:10.3762/bjnano.8.70
- ; noncontact atomic force microscopy; quartz tuning forks; scanning tunneling microscopy; self-sensing probe; Introduction Scanning tunneling microscopy (STM) [1] and non-contact atomic force microscopy (NC-AFM) [1][2][3] are powerful methods allowing the visualization of the atomic structure of a surface
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